Name

Sun Kai

Gender

Female

Title

Associate Research Fellow，Associate Professor

Nationality

China

Education

Ph.D.

E-Mail

sunkai1@ime.ac.cn

Department

R&D Center of high frequency and high voltage device and integrated circuit

Address

3 Beitucheng West Road, Chaoyang District, Beijing, PR China

Postcode

100029

Tel

18629404731

Fax

Education Background

2008/09-2013/05  Ph.D., Xi'an Jiaotong University, ,

2003/09- 2006/04  Master, Xi'an Jiaotong University,

1996/09-2000/05  Bachelor, Wuhan University,

Professional Experience

2018/09-Now Associate Research Fellow, China Institute of Microelectronics, Scientific Research

2007/07- 2018/09 Associate Professor, Xi'an University of Architectural Science and Technology

2012/02- 2013/02, Visiting Scholar, School of Electronic Information Engineering, Ohio State University, USA

2006/12-2007/06, Software Testing Engineer, Sybase Software (China) Co. Ltd

2006/05-2006/11 Project Enginee，Huawei Technologies Co., Ltd

2002/08-2003/07 Software Engineer，BlueStar Technology Co.,Ltd

2002/03-2002/06 Software Enginee， TTOD　Ltd

000/07-2002/01 Software Engineer ，PixArt Imaging Inc.

Publications

Journal：

[1] Sun Kai, Wu Jin, Semiconductor chip’s quality analysis based on its high dimensional test data[J],Annals of Operations Research, 2019, S.I. : RELIABILITY MODELING WITH APPLICATIONS BASED ON BIG DATA

[2] Gao Xu，Gao Jianmin, Sun Kai etc. Online Fault Diagnosis of Modern Process industry System based on Color-spectrum, Journal of  Shanghai  Jiaotong  University (Science) 2016,21（5）:621-628

[3] Sun Kai, Gao Jianmin, Gao Zhiyong, Jiang Hongquan, Gao Xu, Plant-wide quantitative assessment of a process industry system’s operating state based on color-spectrum[J], Mechanical Systems and Signal Processing. 2015（60-61）:644-655

[4]Sun kai,Gao Jianmin,Gao Zhiyong，Helath State Analysis of Modern Industry System through System Cololr Picture Based on the Data-driven[J]. Journal of Mechanical Engineering，2012年48(18)：186-191

Scholarly Monograph

[1] State Analysis of Complex Electromechanical System Based on Color-spectrum，Press of Northwest Polytechnical University， ISBN：978-7-5612-5079-2

Textbook

[1] Electromagnetic fields in electrical engineering，Press of Northwest Polytechnical University， ISBN：978-7-5612-5078-5

Research Interests  

Complex Product Reliability Analysis, Intelligent Manufacturing, Artificial Intelligence and Big Data

Projects and Subjects Participated

Leader:

[1] National Natural Science Foundation Youth Project，No：51705393，

[2] Key Foundation Research Projects under the Foundation Strengthening Plan

Participants：

[1] 2017 National Key Scientific Instrument Development Projects,  No：2017YF0106602）

[2] National 03 project, No：2016ZX03001002

[3] XP Porject

[4] Key deployment projects of CAS

Patents Application

[1] State assessment of complex electromechanical system based on two-dimensional color-spctrum, China. No: ZL201110146488.5

[2] Batch Test Method of Semiconductor Chip Based on Fault-spectrum of Fault Data No：201611199475.3

[3] Pinan Semiconductor Test Data Analysis Software V2.0， No： 2017SR373272

[4] Visualization and Quantitative Analysis of Nonlinear Mass High-dimensional Sequence Data Classification, No：20171047831.0