Name

HUO Shuchun

Gender

Male

Title

Associate Professor

Nationality

China

Education

Ph.D

E-Mail

Department

Optoelectronic R & D center

Address

3 Beitucheng West Road, Chaoyang District, Beijing, PR China

Postcode

100029

Tel

Fax

Education Background

2012.09-2017.01, Tianjin University, Ph.D in Instrument Science and Technology.

2014.12-2015.11, Johannes Kepler University Linz, Institute of Experimental Physics, Joint Training Ph.D Student.

Professional Experience

2021.05-Present, Associate Professor, Institute of Microeconomics of Chinese Academy of Science.

2018.05-2021.04, Postdoctoral Fellow in School of Precision Instrument and Opto-electronics Engineering, Tianjin University.

Publications

First/Corresponding author

1.       S. Huo, H Wang, C Hu*, C Yao, W Shen, X Hu, and X Hu. Measuring the Multilayer Silicon based Microstructure Using Differential Reflectance Spectroscopy. Optics Express, 2021, Vol. 29 No. 3.

2.       C Yao, S. Huo*, W Shen, Z Sun, X Hu, X Hu and C Hu*. Assessing the quality of polished brittle optical crystal using quasi-Brewster angle technique. Precision Engineering, 2021, Vol. 72, P184-191.

3.       Chunguang Hu, Hao Wang, Yongtao Shen, Shuchun Huo*, Wanfu Shen, Xiaodong Hu and Xiaotang Hu, Imaging layer thickness of large-area graphene using reference-aided optical differential reflection technique. Optics Letters, 2020, Vol. 45 No. 15.

4.       Chunguang Hu, Hao Wang, Shuchun Huo*, Wanfu Shen, and Xiaotang Hu, Rapid reflectance difference microscopy based on liquid crystal variable retarder, Journal of Vacuum Science & Technology B 37, 050604 (2019).

5.       S. Huo, C Hu, W Shen, et al. Normal-incidence reflectance difference spectroscopy based on a liquid crystal variable retarder[J], Applied optics, 2016, 55(33): 9334-9340.

6.       Huo S., Hu C., Li Y., et al. Optimization for liquid crystal variable retarder-based spectroscopic polarization measurements[J]. Applied optics, 2014, 53(30): 7081-7086.

Research Interests

Optical Measurement Technology and Precision Instrument in Integrated Circuit